V9000-ABI-Storage Series

Applied to the burn-in testing requirements of storage devices such as eMMC, UFS, and Nand/Nor Flash.

Fully automated testing process ensures traceability.

Full-process ESD control during testing ensures DUT quality.

Single sorter module achieves an ultra-high UPH of up to 6000.

Ultra-precise DUT test pressure control: accuracy of 0.1N, carefully protecting the chip and socket.

Integrated high-precision measurements: OS/Leakage, IDD6, and other DC tests.

Supports vector depth of 128M per pin.

High-precision visual inspection (3D5S, appearance defect detection, QR code recognition, etc.) ensures testing quality.

Full-stack in-house R&D (embedded software, FPGA, hardware, motion control, electrical, mechanical, thermal design, etc.) enables a fast and responsive service system.

Incorporates AI large models to enable intelligent IC testing.

In 2021, acquired a renowned Japanese handler company with 40 years of precision engineering heritage, offering exquisite product technology and an ultra-low Jam Rate.

World's first ABI fully automated burn-in testing.

Independent temperature control design provides excellent temperature precision and uniformity for target DUTs.

High-precision visual AOI inspection ensures testing quality.

Incorporates AI large models to enable intelligent IC testing.

Full-process ESD control ensures safe and controllable testing procedures.