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Efficient system-level testing technology

Accelerate the take-off of automotive semiconductors and AIGC

Core technology

Automated aging test solution, improving system efficiency 3 times!
Automated aging test solution, improving system efficiency 3 times!
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High parallel testing number, up to 1024DUTs can be tested at the same time
High parallel testing number, up to 1024DUTs can be tested at the same time
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High-precision vision positioning technology, precise chip pick & place P&P components
High-precision vision positioning technology, precise chip pick & place P&P components
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Perfect 3D AOI system, ensuring product quality and traceability
Perfect 3D AOI system, ensuring product quality and traceability
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News

HBM Reliability at Scale: Addressing Advanced Memory Testing Challenges
HBM Reliability at Scale: Addressing Advanced Memory Testing Challenges
2026-07-23
High-bandwidth memory (HBM) has become a critical memory technology for the next generation of artificial intelligence (AI) computing and high-performance computing (HPC) systems. As AI workloads continue to expand, the demand for higher memory bandwidth, improved power efficiency, and long-term sys
Unite for a New AI Ecosystem, Reach New Heights in Chip Testing
Unite for a New AI Ecosystem, Reach New Heights in Chip Testing
2026-07-02
The pervasive penetration of artificial intelligence technology is driving the global semiconductor industry into an in-depth iteration cycle. As the core foundation of the intelligent industry, chips’ performance iteration, quality control and mass production verification capabilities have become
Vertical Power Delivery (VPD) in AI Systems
Vertical Power Delivery (VPD) in AI Systems
2026-07-01
1. IntroductionIn advanced AI compute systems, power delivery is increasingly a primary design constraint alongside compute density and memory bandwidth. As GPU architectures scale toward higher parallelism and increased workload intensity, device-level current demand is reaching kiloampere-class op

Why choose Acroview

Innovation
Innovation
Technological leadership
Technological leadership
Continuous focus
Continuous focus
Global service
Global service
Integrate test solutions for different IC, Tray, BIB boards
Global service
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Partner

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Acroview technology

All-out effort, professional focus
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