MEMS Sensor Test Solution

MEMS sensors integrate multiple physical fields such as mechanical, electrical, thermal, magnetic, and fluid dynamics. Testing requires the simultaneous application and precise control of multi-dimensional physical stimuli including acceleration, angular velocity, pressure, temperature, and magnetic fields. Acroview's MEMS sensor test solutions focus on integration, intelligence, high speed, and modularity, providing a series of solutions from sensor activation and calibration to burn-in testing. These help customers address core challenges in sensor testing while improving performance and reliability.

Product Advantages

• Full-process test solutions from sensor activation, calibration to burn-in

• Highly reliable, ultra-high precision physical excitation sources (high-precision turntable, high-precision pressure source)

• Precise independent temperature control technology

• Modular product design supports customized requirements

MEMS Inertial Sensor Activation Solution

Acroview's inertial sensor activation solution is designed for MEMS resonant structure oscillation startup and closed-loop locking (electrical activation). This activation test solution not only performs electrical performance testing on sensors and executes activation and OTP programming via SPI/PSI5 protocols, but also can be equipped with a turntable for preliminary testing and functional verification after activation.

Register Programming (SPI, PSI5)

OS Testing

MEMS Inertial Sensor Calibration Solution

An all-in-one fully automatic calibration, testing, and sorting machine for MEMS accelerometers and gyroscopes. Acroview's inertial sensor calibration solution supports multiple digital protocols such as PSI5, SPI, and I2C, and offers a high-efficiency dual-turntable test architecture that significantly improves test efficiency. It also supports high-temperature, ambient-temperature, low-temperature semi-automated testing, as well as military-grade metrology systems, providing a highly reliable test platform for MEMS sensor calibration.

MEMS Sensor Three-Temperature Burn-In Test Solution

Residual stress in MEMS microstructures generated during packaging manufacturing needs to be released to prevent impact on performance indicators such as zero drift, non-linearity, and repeatability due to structural stress instability. Therefore, MEMS sensors require burn-in testing before leaving the factory. Acroview's fully automatic burn-in test system V9000, designed for MEMS sensor burn-in application requirements, supports three-temperature or ambient/high-temperature burn-in testing and sorting, and is the world's first large-scale parallel stackable burn-in test system.