Acroview technology
国家级专精特新小巨人企业
Acroview's NAND storage particle SLT test solution is specifically designed for 3D NAND storage particles, providing a turn-key full-stack testing service that effectively eliminates early failures. The temperature testing range and accuracy have been comprehensively upgraded to meet demanding enterprise-grade requirements. This is a mature, fully automated test solution validated by the market.
Product Advantages
Product Specifications
| PC | CPU | Intel Xeon W-2400/3400 |
| RAM | 128GB-256GB DDR5 6400 MT/s (ECC) | |
| Operating System | Linux Ubuntu 22.04 LTS, 1TB NVMe PCIe 4.0/5.0 SSD as OS drive | |
| Motherboard Interfaces | HDMI, 1000/100/10 Mbps Ethernet, USB 2.0 | |
| Test Board Communication Interfaces | Reference Voltage Control | Independent adjustment, step accuracy up to 5mV |
| Test Board Communication | Gold finger connection, supports 64 DUTs per side | |
| UART | UART or USB-HUB communication, supports 64 DUTs tested in parallel | |
| Power Management | VCC | 2.3V-3.6V, output current ≥2A |
| VCCQ | 1.14V-1.26V | |
| VCCQ2 | 0.5V-0.9V | |
| Voltage Accuracy | ±2mV | |
| Voltage Adjustment Step | 0.5mV | |
| Stress Testing | Pattern Testing | Supports various pattern traversals, adaptable to multiple screening methods |
| Stress Simulation | Supports fast P/E Cycle endurance/lifetime burn-in testing | |
| Anomaly Simulation | Supports bit flip injection and protocol violation testing | |
| Temperature Control | Independent Temperature Control | Supported |
| Temperature Range | -40°C to 125°C | |
| Temperature Accuracy | ±3°C | |
| Particle Screening Test | Information Reading | ID read, bad block management |
| Block Level | Supports Latency, (SLC/TLC) copy back, read disturb, IVS, program/erase suspend | |
| Adjustable Test Flow | Software supports engineers in ordering test items |
400-890-0755
- 7F, Hanking Center (SOMA) 9968 Shennan Avenue, Nanshan Dist, Shenzhen, 518052, P.R.C
- sales@acroview.com