V9000-ABI

Summary
Feature

ACROVIEW's V9000 series test sorter is applied for Burn-In reliability testing of products such as high-reliability power modules for AI servers, AI large-model training SOCs, GPUs, CPUs, and automotive-grade intelligent driving SOCs.

V9000-ABI
  • V9000-ABI

    Acroview's V9000 series test sorter is applied for Burn-In reliability testing of products such as high-reliability power modules for AI servers, AI large-model training SOCs, GPUs, CPUs, and automotive-grade intelligent driving SOCs.

     

    The V9000 series fully automated burn-in test system revolutionarily proposes a "fully in-line" solution for Burn-In testing. This integrates the entire Burn-In testing process into an automated control workflow, thereby avoiding issues such as unrecorded operations, lack of traceability, and potential ESD risks caused by manual intervention. Simultaneously, Acroview's proprietary TempJIT™ high-power burn-in test temperature control technology can support a maximum single DUT power of up to 1500W, which is over 1.5 times the maximum power support capability of current traditional burn-in test equipment.

    V9000-ABI


    V9000-ABI Overall Machine Layout

    V9000-ABI


    Feature functions
    V9000-ABI - Full-process ESD control with comprehensive ion fan coverage.
    Full-process ESD control with comprehensive ion fan coverage.
    V9000-ABI - Industry-leading thermal testing performance, supporting a maximum single DUT dissipation power exceeding 1000W.
    Industry-leading thermal testing performance, supporting a maximum single DUT dissipation power exceeding 1000W.
    V9000-ABI - Modular design allows testing units to be independently upgraded and maintained without disrupting production.
    Modular design allows testing units to be independently upgraded and maintained without disrupting production.
    V9000-ABI - Independent temperature control per DUT with ultra-high precision, reducing burn-in power consumption.
    Independent temperature control per DUT with ultra-high precision, reducing burn-in power consumption.
    V9000-ABI - High-current programmable power supply supporting high-power DUT testing.
    High-current programmable power supply supporting high-power DUT testing.
    V9000-ABI - Comprehensive AOI inspection, optionally equipped with 3D5S vision inspection and chip QR code reading capabilities.
    Comprehensive AOI inspection, optionally equipped with 3D5S vision inspection and chip QR code reading capabilities.
  • Supported Device TypesQFN, QFP, LGA, PLCC, PGA, CSP, TSOP, etc.
    Device Size RangeFrom 3x3 mm to 100x100 mm
    Operation ModeNormal Mode, Practice Mode, Dry-Run Mode
    Control SystemIndustrial Computer
    Operating SystemWINDOWS
    MTBA> 4 Hours
    UPHUPH ≥ 1000
    Down Time< 3% (when running continuously for 3 months)
    Index Time< 0.4s (Minimum: 0.38s)
    Jam Rate≤ 1/5000
    Temperature Control RangeRoom Temperature to 125°C (DUT temperature can reach up to 150°C)
    Tray StandardJEDEC Standard
    Tray Loading/Unloading Mechanism1x Automatic Loader / 4x Automatic Unloaders (Expandable)
    Empty Tray HandlingGripper Type
    Software BinningBin1 - Bin16
    Power Supply Specification50/60 Hz, Max. 50A, AC 380V (Three-Phase)
    Machine Weight3500 kg
    Machine Dimensions (L x W x H)3189 x 3400 x 1920 mm
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