IPS Series Engineering Final Test (FT) Handler

Summary
Acroview's IPS Series Engineering FT Handler originates from the company's classic IPS series 4-axis linear transfer platform architecture. Building upon 20 years of semiconductor handler R&D experience from Acroview's Japan-based development team, it supports engineering application testing and sorting with Load Boards from various ATE equipment. The product accommodates multiple input/output methods including Tube, Tray, and Reel, and also supports bowl feeder loading for bulk ICs. It provides a flexible test handling solution for applications such as chip design verification testing, small-batch sample delivery, and QA sampling tests.
Feature

The Most Flexible Small-Batch Engineering Test Solution!

IPS Series Engineering Final Test (FT) Handler
  • Acroview's IPS Series Engineering Final Test (FT) Handler originates from the company's classic IPS series 4-axis linear transfer platform architecture. Building upon 20 years of semiconductor handler R&D experience from Acroview's Japan-based development team, it supports engineering application testing and sorting with Load Boards from various ATE equipment. The product accommodates multiple input/output methods including Tube, Tray, and Reel, and also supports bowl feeder loading for bulk ICs. It provides a flexible test handling solution for applications such as chip design verification testing, small-batch sample delivery, and QA sampling tests.

     

    The Most Flexible Small-Batch Engineering Test Solution!

    Feature functions

    High product flexibility, supporting chip package sizes from 1x1mm to 50x50mm.

    Flexible configuration of input/output methods: Tube, Tray, Reel, Bowl Feeder (bulk).

    Acroview's high-precision vision alignment system eliminates the need for traditional pre-alignment unit positioning.

    High-precision temperature control system, supporting various methods such as TEC, ATC, and thermal air stream.

    High-sensitivity force-controlled contact mechanism, supporting a range of 0.5~10 kgf with an accuracy of ±0.1 kgf.

    Modular design, supports quick line changeover within 3 minutes.

    Optional AOI module and 3D/5-Side inspection, enabling an all-in-one solution for testing, sorting, and AOI.

    IPS Series Engineering Final Test (FT) Handler - IPS3000H
    IPS Series Engineering Final Test (FT) Handler - 3D/5-Side Inspection Module
    3D/5-Side Inspection Module
    IPS Series Engineering Final Test (FT) Handler - Vision Inspection AOI Module
    Vision Inspection AOI Module
    IPS Series Engineering Final Test (FT) Handler - Vision Alignment Camera
    Vision Alignment Camera
    IPS Series Engineering Final Test (FT) Handler - Force-Controlled Contact Head
    Force-Controlled Contact Head
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