V9000-SLT

Acroview's V9000-SLT series System-Level Test (SLT) sorter is applied for the system-level testing of integrated circuit products in fields such as high-speed memory devices (e.g., LPDDR), AI servers, edge computing controllers, high-speed interconnect ICs, CPUs, GPUs, and large-scale automotive electronics SOCs. This SLT test sorting system shares the same platform as Acroview's world-first ABI fully automated burn-in test system, the V9000 series. It revolutionarily introduces an innovative stackable SLT testing solution, significantly increasing the number of parallel-testable DUTs for SLT. Through its innovative modular testing unit design, it achieves an efficiency improvement of over 10 times compared to traditional pick-and-place SLT test Handlers.

World's first stackable SLT test system.

Delivers a 10X dramatic improvement in testing efficiency!

Ultra-high parallel test count, supporting up to 1200 DUTs for simultaneous testing.

Independent temperature control design provides excellent temperature precision and uniformity for target DUTs.

Supports SLT testing for ultra-high-power SOCs, with the highest system power supply capability.

Capable of supporting up to 1.5 kW per DUT.

Supports three-temperature SLT testing, with a temperature range of -40°C to +125°C.

Provides multiple communication interface modes, including TCP/IP, UART, USB, and serial port.

Ultra-high space efficiency, significantly reducing the customer's TOC (Total Cost of Test).