V9000-SLT-M

The V9000-SLT-M is a high-performance memory chip test handler launched by Acroview. This equipment is primarily used for the burn-in automatic testing and sorting of products such as eMMC, eMCP, LPDDR, UFS, and UMCP under room temperature and high-temperature environments.

Ultra-High Parallel Testing: Supports parallel testing of 1200 DUTs.

Independent Temperature Control Design, providing excellent temperature control accuracy and uniformity for the target DUT.

High-Precision Vision AOI Inspection to ensure testing quality.

Introduces AI Large Models to build intelligent IC testing.

Supports fully electric adjustment of temperature and pressure, with electrical testing supporting full-feature PMU.

Operational efficiency is ten times that of common equipment currently on the market.

High-Capacity Stackable Test System

Capacity is over 10 times greater than common market equipment.

Interfaces reserved for Overhead Hoist Transport (OHT) and AGV.

 

Independent Temperature and Pressure Control System

Independent temperature monitoring system for each chip.

More precise temperature and pressure control.

 

CCD Camera Intelligent Positioning and Adjustment

Four sets of industrial cameras for precise handling.

Auto Teach for automatic adjustment.

 

ESD Protection System

ESD handling system recognized by leading companies.

Fully integrated loading/unloading system.

Precise Independent Temperature Control Technology

Ultra-high 1200 DUT Parallel Testing Capacity

Modular Test Library Design Supporting Quick Changeover

Comprehensive Full-Process Traceability Control