Memory- SLT Test Solution

The Acroview V9000-SLT test solution delivers efficient, high-quality SLT testing for LPDDR 4/5 products. The solution flexibly integrates with peripherals and operates fully automatically to reduce human error. Featuring an innovative parallel stackable design supporting 1680 DUTs tested simultaneously, it offers high UPH with flexible capacity expansion and changeover. Independent temperature and pressure control enables accurate three-temperature testing, with full traceability to meet high-reliability requirements such as automotive applications.

Ultra-High Parallel Test Count

• Industry-leading support for up to 1680 DUTs tested in parallel

• Ultra-high UPH

High-Precision Independent Temperature Control

• Supports three-temperature/room-to-hot testing with ultra-high UPH

• Ambient to 150℃, ±3℃

• Three-temperature testing: -40℃ to 125℃, ±3℃

• Meets high-reliability testing requirements for automotive and other applications

High-Precision Pressure Control

• Independent pressure control per DUT, accuracy ±0.1N

• Flexible suction nozzle mechanism prevents chip damage during testing

Modular Design and Flexible Production Line

• Innovative modular stackable design

1. Supports on-demand capacity expansion or changeover

2. Meets high-volume production or flexible testing needs for multiple products / small batches

• Full process traceability

1. Chip QR code linked to carrier board and test slot

2. Test process logging

3. Full traceability from chip loading → testing → unloading