HyperTEST

HyperTEST is an innovative FT test equipment from Acroview, suitable for FT testing of various Nand/Nor Flash, MCU/MPU SOC/SiP, and special application ASICs. This solution supports ultra-high parallel test capability: 128 DUTs. Combined with a low-cost, high-capacity LoadBoard design, it provides the most TOC-cost-advantageous FT solution for Nor Flash, Nand Flash, and other new memory chips.

Ultra-high parallel test capability: 128 DUTs, 8 times that of traditional equipment.

Ultra-high UPH: Achieves over 5000 UPH with test times under 40 seconds.

The ideal FT solution for Nor/Nand Flash, MCU, and SiP devices requiring long test durations.

20+ years of Japanese Pick&Place technology ensures stable, high-quality operation.

Flexible material handling design supporting multiple feeding and unloading methods.

Ultra-high UPH > 5000

Test Cycle Time within 40 seconds with no speed reduction!

PPZ

Number of nozzles: 8
Pick and place method: Simultaneous pick and place
High-precision servo drive (+/-0.04mm)
Built-in vacuum generator, no external vacuum pump required
Supports pitch change: 20mm-40mm

Tube Feeder Module

Maximum tubes per load: 50 tubes
Continuous IC feeding interval speed: Fastest 0.3 sec/Pcs
Tube change method: Automatic
Applicable IC package: SOP
IC tube width: 7.6mm~15mm

PPU

Number of suction heads: 2
Suction head spacing: 55mm
Continuous handling speed: Fastest 0.3 sec/PcS
Handling method: Vacuum adsorption